[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) -...

  • Main
  • [IEEE 2008 IEEE Silicon Nanoelectronics...

[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - New observation of an abnormal leakage current in advanced CMOS devices with short channel lengths down to 50nm and beyond

Hsieh, E. R., Chung, Steve S., Lin, Y. H., Tsai, C. H., Liu, P. W., Tsai, C.T., Ma, G. H., Chien, S. C., Sun, S. W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/snw.2008.5418486
File:
PDF, 452 KB
english, 2008
Conversion to is in progress
Conversion to is failed