[IEEE 2008 IEEE Silicon Nanoelectronics Workshop (SNW) - Honolulu, HI, USA (2008.06.15-2008.06.16)] 2008 IEEE Silicon Nanoelectronics Workshop - New observation of an abnormal leakage current in advanced CMOS devices with short channel lengths down to 50nm and beyond
Hsieh, E. R., Chung, Steve S., Lin, Y. H., Tsai, C. H., Liu, P. W., Tsai, C.T., Ma, G. H., Chien, S. C., Sun, S. W.Year:
2008
Language:
english
DOI:
10.1109/snw.2008.5418486
File:
PDF, 452 KB
english, 2008