[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - Statistical observations of NBTI-induced threshold voltage shifts on small channel-area devices
Sato, Takashi, Awano, Hiromitsu, Shimizu, Hirofttmi, Tsutsui, Hiroshi, Ochi, HiroyukiYear:
2012
Language:
english
DOI:
10.1109/isqed.2012.6187510
File:
PDF, 678 KB
english, 2012