[IEEE 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2010.06.1-2010.06.4)] 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Acceptance testing of BGA ball alloys
Allen, Aileen, Henshall, Gregory, Troxel, Kris, Miremadi, Jian, Benedetto, Elizabeth, Holder, Helen, Roesch, MichaelYear:
2010
Language:
english
DOI:
10.1109/ectc.2010.5490903
File:
PDF, 690 KB
english, 2010