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[IEEE 2007 2nd IEEE Conference on Industrial Electronics and Applications - Harbin, China (2007.05.23-2007.05.25)] 2007 2nd IEEE Conference on Industrial Electronics and Applications - A Novel Model of one-class Bearing Fault Detection using SVDD and Genetic Algorithm
Xin-min, Tao, Wan-Hai, Chen, Du Bao-Xiang,, XuYong,, Han-Guang, DongYear:
2007
DOI:
10.1109/iciea.2007.4318518
File:
PDF, 406 KB
2007