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Industrial BIST of embedded RAMs
Camurati, P., Prinetto, P., Reorda, M.S., Barbagallo, S., Burri, A., Medina, D.Volume:
12
Year:
1995
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/MDT.1995.466385
File:
PDF, 931 KB
english, 1995