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[IEEE Forty-Eighth IEEE Holm Conference on Electrical Contacts - Orlando, FL, USA (21-23 Oct. 2002)] Proceedings of the Forty-Eighth IEEE Holm Conference on Electrical Contacts - Reliability analysis and failure prediction study of dynamic contact resistance on contact
ZhiGang Li,, Dong Jiang,, WenHua Li,, XiuPing Su,, Hui Guo,Year:
2002
Language:
english
DOI:
10.1109/holm.2002.1040823
File:
PDF, 410 KB
english, 2002