![](/img/cover-not-exists.png)
[IEEE Comput. Soc 23rd IEEE VLSI Test Symposium - Palm Springs, CA, USA (1-5 May 2005)] 23rd IEEE VLSI Test Symposium (VTS'05) - Effective TARO Pattern Generation
Intaik Park,, Al-Yamani, A., McCluskey, E.J.Year:
2005
Language:
english
DOI:
10.1109/VTS.2005.43
File:
PDF, 144 KB
english, 2005