[IEEE 2008 13th IEEE European Test Symposium (ETS) -...

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[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories

Godard, Benoit, Daga, Jean-Michel, Torres, Lionel, Sassatelli, Gilles
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Year:
2008
Language:
english
DOI:
10.1109/ets.2008.21
File:
PDF, 476 KB
english, 2008
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