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[IEEE 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Kuala Lumpur, Malaysia (2012.09.19-2012.09.21)] 2012 10th IEEE International Conference on Semiconductor Electronics (ICSE) - Development of Automated Neighborhood Pattern Sensitive Fault Syndrome Generator for SRAM
Rusli, J. R., Sidek, R. M., Zuha, W. H. WanYear:
2012
Language:
english
DOI:
10.1109/smelec.2012.6417191
File:
PDF, 1.05 MB
english, 2012