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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Bridging DFM Analysis and Volume Diagnostics for Yield Learning - A Case Study
Turakhia, Ritesh, Ward, Mark, Goel, Sandeep Kuma, Benware, BradyYear:
2009
Language:
english
DOI:
10.1109/vts.2009.37
File:
PDF, 900 KB
english, 2009