[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa...

  • Main
  • [IEEE 2009 27th IEEE VLSI Test...

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - STDF Memory Fail Datalog Standard

Khoche, Ajay, Katz, Jay, Landini, Sauro, Liao, Kochen, Agrawal, Neetu, Plowman, Glenn, Zuo, Song-lin, Lai, Liyang, Rowe, John, Zanon, Thomas
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2009
Language:
english
DOI:
10.1109/vts.2009.29
File:
PDF, 751 KB
english, 2009
Conversion to is in progress
Conversion to is failed