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[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - STDF Memory Fail Datalog Standard
Khoche, Ajay, Katz, Jay, Landini, Sauro, Liao, Kochen, Agrawal, Neetu, Plowman, Glenn, Zuo, Song-lin, Lai, Liyang, Rowe, John, Zanon, ThomasYear:
2009
Language:
english
DOI:
10.1109/vts.2009.29
File:
PDF, 751 KB
english, 2009