[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - A Reconfigurable Built-In Self-Repair Scheme for Multiple Repairable RAMs in SOCs
Tseng, Tsu-wei, Li, Jin-fu, Hsu, Chih-chiang, Pao, Alex, Chiu, Kevin, Chen, EliotYear:
2006
Language:
english
DOI:
10.1109/test.2006.297688
File:
PDF, 124 KB
english, 2006