[IEEE 2006 IEEE International Test Conference - Santa...

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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - A Reconfigurable Built-In Self-Repair Scheme for Multiple Repairable RAMs in SOCs

Tseng, Tsu-wei, Li, Jin-fu, Hsu, Chih-chiang, Pao, Alex, Chiu, Kevin, Chen, Eliot
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Year:
2006
Language:
english
DOI:
10.1109/test.2006.297688
File:
PDF, 124 KB
english, 2006
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