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The Impact of BTI Variations on Timing in Digital Logic Circuits
Fang, Jianxin, Sapatnekar, Sachin S.Volume:
13
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2013.2237910
Date:
March, 2013
File:
PDF, 829 KB
english, 2013