Defect Control in Zinc Oxynitride Semiconductor for...

Solid State Phenomena 2013 / 10 Vol. 205-206

Defect Control in Zinc Oxynitride Semiconductor for High-Performance and High-Stability Thin-Film Transistors

Kim, Hyun Suk, Park, Joon Seok, Kim, Tae Sang, Son, Kyoung Seok, Seon, Jong Baek, Seo, Seok Jun, Kim, Sun Jae, Lee, Sun Hee, Kim, Eok Su, Ryu, Myoung Kwan, Han, Seung Wu, Cho, Seong Ho, Park, Young So
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Volume:
205-206
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/ssp.205-206.446
Date:
October, 2013
File:
PDF, 400 KB
english, 2013
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