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[IEEE IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging, 2005. - Austin, TX, USA (Oct. 24-26, 2005)] IEEE 14th Topical Meeting on Electrical Performance of Electronic Packaging, 2005. - Scalable driver I/O macromodels for statistical analysis
Mutnury, B., Swaminathan, M., Cases, M., Nam Pham,, de Araujo, D.N.Year:
2005
Language:
english
DOI:
10.1109/epep.2005.1563747
File:
PDF, 922 KB
english, 2005