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[IEEE 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Monterey, CA, USA (2007.08.26-2007.08.30)] 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Air-Gap Application and Simulation Results for Low Capacitance in 60nm NAND Flash Memory
Kim, Sukjoong, Cho, Wheewon, Kim, Junggeun, Lee, Byungseok, Park, SungkiYear:
2007
Language:
english
DOI:
10.1109/nvsmw.2007.4290578
File:
PDF, 428 KB
english, 2007