[IEEE 2014 IEEE 27th Canadian Conference on Electrical and Computer Engineering (CCECE) - Toronto, ON, Canada (2014.5.4-2014.5.7)] 2014 IEEE 27th Canadian Conference on Electrical and Computer Engineering (CCECE) - Electromigration testing of wire bonds
Hook, Michael, Xu, Di, Mayer, MichaelYear:
2014
Language:
english
DOI:
10.1109/ccece.2014.6901111
File:
PDF, 8.45 MB
english, 2014