[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Memory BIST using ESP
Xiaogang Du,, Reddy, S.M., Ross, D.E., Wu-Tung Cheng,, Rayhawk, J.Year:
2004
Language:
english
DOI:
10.1109/vtest.2004.1299250
File:
PDF, 1.29 MB
english, 2004