[IEEE 2012 17th IEEE European Test Symposium (ETS) -...

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[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Enhanced wafer matching heuristics for 3-D ICs

Pavlidis, Vasilis F., Xu, Hu, De Micheli, Giovanni
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Year:
2012
Language:
english
DOI:
10.1109/ets.2012.6233032
File:
PDF, 203 KB
english, 2012
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