[IEEE 2010 IEEE 16th International On-Line Testing...

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[IEEE 2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010) - Corfu, Greece (2010.07.5-2010.07.7)] 2010 IEEE 16th International On-Line Testing Symposium - An on-line fault detection technique based on embedded debug features

Grosso, M., Reorda, M. Sonza, Portela-Garcia, M., Garcia-Valderas, M., Lopez-Ongil, C., Entrena, L.
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Year:
2010
Language:
english
DOI:
10.1109/iolts.2010.5560215
File:
PDF, 219 KB
english, 2010
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