[IEEE IEEE MTT-S International Microwave Symposium - IMS...

[IEEE IEEE MTT-S International Microwave Symposium - IMS 2003 - Philadelphia, PA, USA (8-13 June 2003)] IEEE MTT-S International Microwave Symposium Digest, 2003 - A new characterization technique of "Four hot S parameters" for the study of nonlinear parametric behaviors of microwave devices

Gasseling, T., Barataud, D., Mons, S., Nebus, J.M., Villotte, J.P., Quere, R.

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Volume:

Year:

2003

Language:

english

DOI:

10.1109/mwsym.2003.1210458

File:

PDF, 288 KB

english, 2003

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