[IEEE 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Novosibirsk, Russia (2012.10.2-2012.10.4)] 2012 IEEE 11th International Conference on Actual Problems of Electronics Instrument Engineering (APEIE) - Creation of tunnel junction with scanning probe lithography
Pavlova, Anastasia Yu., Khivintsev, Yurii V., Filimonov, Yurii A., Tiercelin, N., Pernod, P.Year:
2012
Language:
russian
DOI:
10.1109/apeie.2012.6628942
File:
PDF, 434 KB
russian, 2012