[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT 2011) - Hsinchu (2011.4.25-2011.4.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Important test selection for screening potential customer returns
Sumikawa, N, Drmanac, D, Li-C Wang,, Winemberg, L, Abadir, M SYear:
2011
Language:
english
DOI:
10.1109/vdat.2011.5783603
File:
PDF, 181 KB
english, 2011