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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT 2011) - Hsinchu (2011.4.25-2011.4.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Important test selection for screening potential customer returns

Sumikawa, N, Drmanac, D, Li-C Wang,, Winemberg, L, Abadir, M S
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Year:
2011
Language:
english
DOI:
10.1109/vdat.2011.5783603
File:
PDF, 181 KB
english, 2011
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