[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - The application of frequency and amplitude response spectroscopy analyzing
Xu, Li, Zhang, Ying-qiang, Zhan, Shu-yue, Wang, Xiao-pingYear:
2010
Language:
english
DOI:
10.1109/imtc.2010.5488013
File:
PDF, 750 KB
english, 2010