Leakage control with efficient use of transistor stacks in...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2002 / 02 Vol. 10; Iss. 1

Leakage control with efficient use of transistor stacks in single threshold CMOS

Johnson, M.C., Somasekhar, D., Lih-Yih Chiou,, Roy, K.
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Volume:
10
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/92.988724
Date:
February, 2002
File:
PDF, 80 KB
english, 2002
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