[IEEE 2010 43rd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO) - Atlanta, GA, USA (2010.12.4-2010.12.8)] 2010 43rd Annual IEEE/ACM International Symposium on Microarchitecture - SAFER: Stuck-At-Fault Error Recovery for Memories
Seong, Nak Hee, Woo, Dong Hyuk, Srinivasan, Vijayalakshmi, Rivers, Jude A., Lee, Hsien-Hsin S.Year:
2010
Language:
english
DOI:
10.1109/micro.2010.46
File:
PDF, 591 KB
english, 2010