[IEEE 2005 IEEE International SOI - Honolulu, HI, USA (03-06 Oct. 2005)] 2005 IEEE International SOI Conference Proceedings - Total Dose Performance of Conventional Static and Dynamic Circuits In a Radhard 0.18-μm FDSOI Process
Gouker, P., Tyrrell, B., Wyatt, P., Austin, E., Soares, A., Chen, C.K., Burns, J.Year:
2005
Language:
english
DOI:
10.1109/soi.2005.1563582
File:
PDF, 2.17 MB
english, 2005