[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Characterisation of reliability of compound semiconductor devices using electrical pulses
Brandt, M., Krozer, V., Schobler, M., Bock, K.-H., Hartnagel, H.-L.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888239
File:
PDF, 415 KB
english, 1996