[IEEE IC's (ISPSD) - San Diego, CA, USA (2011.05.23-2011.05.26)] 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs - Physical analysis of carrier lifetime controlled IGBT [II]
Tadokoro, Chihiro, Kaneda, M., Takano, K., Kusunoki, S., Minato, T., Yahiro, J., Hatade, K.Year:
2011
Language:
english
DOI:
10.1109/ispsd.2011.5890809
File:
PDF, 872 KB
english, 2011