[IEEE Sixth Chinese Optoelectronics Symposium - Hong Kong, China (12-14 Sept. 2003)] Proceedings of the Sixth Chinese Optoelectronics Symposium (IEEE Cat. No.03EX701) - Optical characterization of the narrow-band filter with in-situ thickness monitoring at fixed wavelength
Jian Miao,, Da-Yu Chen,, Rong-Jun Zhang,, Li Li,, Yun-Hua Wu,, Liang-Yao Chen,Year:
2003
Language:
english
DOI:
10.1109/cos.2003.1278170
File:
PDF, 221 KB
english, 2003