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[IEEE 2006 International Conference on Simulation of Semiconductor Processes and Devices - Monterey, CA, USA (2006.09.6-2006.09.8)] 2006 International Conference on Simulation of Semiconductor Processes and Devices - A New Statistical Model for SILC Distribution of Flash Memory and the Effect of Spatial Trap Distribution
Shim, Byung, Jin, Seonghoon, Park, Young, Min, HongYear:
2006
Language:
english
DOI:
10.1109/sispad.2006.282901
File:
PDF, 4.10 MB
english, 2006