[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Gate-Exhaustive and Cell-Aware pattern sets for industrial designs
Hapke, Friedrich, Schloeffel, Juergen, Hashempour, Hamidreza, Eichenberger, StefanYear:
2011
Language:
english
DOI:
10.1109/vdat.2011.5783604
File:
PDF, 156 KB
english, 2011