Comments on "Flash memory under cosmic and alpha...

IEEE Transactions on Device and Materials Reliability 2005 / 06 Vol. 5; Iss. 2

Comments on "Flash memory under cosmic and alpha irradiation"

Cellere, G., Paccagnella, A.
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Volume:
5
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2005.848069
Date:
June, 2005
File:
PDF, 49 KB
english, 2005
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