Double snapback in SOI nMOSFETs and its application for SOI ESD protection
Verhaege, K., Groeseneken, G., Colinge, J.-P., Maes, H.E.Volume:
14
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.225561
Date:
July, 1993
File:
PDF, 270 KB
english, 1993