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[IEEE 21st International Reliability Physics Symposium - Phoenix, AZ, USA (1983.04.5-1983.04.7)] 21st International Reliability Physics Symposium - Hot Electron Reliability Modeling in VLSI Devices
Ito, Akira, Swasey, Henry A., George, E. W.Year:
1983
Language:
english
DOI:
10.1109/irps.1983.361967
File:
PDF, 5.39 MB
english, 1983