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[IEEE 2009 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2009.05.10-2009.05.14)] 2009 IEEE International Memory Workshop - A New Read-Disturb Failure Mechanism Caused by Boosting Hot-Carrier Injection Effect in MLC NAND Flash Memory
Wang, Hsin-Heng, Shieh, Pei-Shan, Huang, Chiu-Tsung, Tokami, Kenji, Kuo, Ricky, Chen, Shin-Hsien, Wei, Houng-Chi, Pittikoun, Saysamone, Aritome, SeiichiYear:
2009
Language:
english
DOI:
10.1109/imw.2009.5090574
File:
PDF, 227 KB
english, 2009