Wafer-Level Defect Screening for “Big-D/Small-A”...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2009 / 04 Vol. 17; Iss. 4

Wafer-Level Defect Screening for “Big-D/Small-A” Mixed-Signal SoCs

Bahukudumbi, S., Ozev, S., Chakrabarty, K., Iyengar, V.
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Volume:
17
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2008.2006075
Date:
April, 2009
File:
PDF, 394 KB
english, 2009
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