[IEEE 2010 68th Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2010.06.21-2010.06.23)] 68th Device Research Conference - Geometry dependent tunnel FET performance - dilemma of electrostatics vs. quantum confinement
Lu, Yeqing, Seabaugh, A., Fay, P., Koester, S. J., Laux, S. E., Haensch, W., Koswatta, S. O.Year:
2010
Language:
english
DOI:
10.1109/drc.2010.5551905
File:
PDF, 1.07 MB
english, 2010