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[IEEE IEEE Radiation Effects Data Workshop, 2005. - Seattle, WA, USA (11-15 July 2005)] IEEE Radiation Effects Data Workshop, 2005. - Total dose degradation of low-dropout voltage regulators
Miyahira, T.F., Rax, B.G., Johnston, A.H.Year:
2005
Language:
english
DOI:
10.1109/redw.2005.1532678
File:
PDF, 267 KB
english, 2005