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[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Reliability Analysis of Self-Repairable MEMS Accelerometer
Xiong, Xingguo, Wu, Yu-liang, Jone, Wen-benYear:
2006
Language:
english
DOI:
10.1109/dft.2006.54
File:
PDF, 205 KB
english, 2006