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[IEEE 2004 IEEE International SOI Conference - Charleston, SC, USA (4-7 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - History-effect-conscious SPICE model extraction for PD-SOI technology
Goo, J.-S., An, J.X., Thuruthiyil, C., Ly, T., Chen, Q., Radwin, M., Zhi-Yuan Wu,, Lee, M.S.L., Zamudio, L., Yonemura, J., Assad, F., Pelella, M.M., Icel, A.B.Year:
2004
Language:
english
DOI:
10.1109/soi.2004.1391597
File:
PDF, 171 KB
english, 2004