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[IEEE 2007 IEEE/ASME international conference on advanced intelligent mechatronics - Zurich, Switzerland (2007.09.4-2007.09.7)] 2007 IEEE/ASME international conference on advanced intelligent mechatronics - Electrostatic forces and micromanipulator design: on the importance of surface topography parameters
Lhernould, Marion Sausse, Delchambre, Alain, Regnier, Stephane, Lambert, PierreYear:
2007
Language:
english
DOI:
10.1109/aim.2007.4412433
File:
PDF, 550 KB
english, 2007