[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - BIST Power Reduction Using Scan-Chain Disable in the Cell Processor
Zoellin, Christian, Wunderlich, Hans-joachim, Maeding, Nicolas, Leenstra, JensYear:
2006
Language:
english
DOI:
10.1109/test.2006.297695
File:
PDF, 506 KB
english, 2006