[IEEE 2006 IEEE International Test Conference - Santa...

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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - BIST Power Reduction Using Scan-Chain Disable in the Cell Processor

Zoellin, Christian, Wunderlich, Hans-joachim, Maeding, Nicolas, Leenstra, Jens
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Year:
2006
Language:
english
DOI:
10.1109/test.2006.297695
File:
PDF, 506 KB
english, 2006
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