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A new class of codes in Lee metric and their application to error-correcting modulation codes
Krachkovsky, V.Yu., Yuan Xing Lee,, Davydov, V.A.Volume:
32
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.539222
Date:
January, 1996
File:
PDF, 331 KB
english, 1996