[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Spare Parts in Analog Circuits: a Filter Example
Schuler, Erik, Antonio de Souza, Adao Junior, Carro, LuigiYear:
2007
Language:
english
DOI:
10.1109/dft.2007.13
File:
PDF, 354 KB
english, 2007