[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Built-in reseeding for serial BIST
Al-Yamani, A.A., McCluskey, E.J.Year:
2003
DOI:
10.1109/vtest.2003.1197634
File:
PDF, 794 KB
2003