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[IEEE 2013 IEEE Custom Integrated Circuits Conference - CICC 2013 - San Jose, CA, USA (2013.09.22-2013.09.25)] Proceedings of the IEEE 2013 Custom Integrated Circuits Conference - Thermal noise modeling of nano-scale MOSFETs for mixed-signal and RF applications
Chen, Chih-Hung, Chen, David, Lee, Ryan, Lei, Peiming, Wan, DanielYear:
2013
Language:
english
DOI:
10.1109/cicc.2013.6658426
File:
PDF, 436 KB
english, 2013