Measurement of threshold voltages of thin-film...

IEEE Electron Device Letters 1991 / 12 Vol. 12; Iss. 12

Measurement of threshold voltages of thin-film accumulation-mode PMOS/SOI transistors

Terao, A., Flandre, D., Lora-Tamayo, E., Van de Wiele, F.
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Volume:
12
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.116954
Date:
December, 1991
File:
PDF, 234 KB
english, 1991
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