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Effect of Gate Dielectrics on the Performance of P-Type Cu2O TFTs Processed at Room Temperature
Al-Jawhari, H.A., Caraveo-Frescsa, J.A.Volume:
856
Language:
english
Journal:
Advanced Materials Research
DOI:
10.4028/www.scientific.net/amr.856.215
Date:
December, 2013
File:
PDF, 1.23 MB
english, 2013