[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Low-Density Triple-Erasure Correcting Codes for Dependable Distributed Storage Systems
Ohde, Hiroyuki, Kaneko, Haruhiko, Fujiwara, EijiYear:
2006
Language:
english
DOI:
10.1109/dft.2006.42
File:
PDF, 188 KB
english, 2006